The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Jun. 07, 2021
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventor:

Yuji Mizoguchi, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/32 (2006.01); G01B 21/16 (2006.01);
U.S. Cl.
CPC ...
G01B 21/32 (2013.01); G01B 21/16 (2013.01);
Abstract

An accuracy diagnostic device that diagnoses an influence on an accuracy of a machine tool due to a thermal deformation includes a temperature change rate calculation unit, an accuracy influence degree calculation unit, and an accuracy stabilization time period calculation unit. The temperature change rate calculation unit calculates a rate of a temperature change in a predetermined portion of the machine tool as a temperature change rate. The accuracy influence degree calculation unit calculates an influence degree on the machine tool accuracy due to the thermal deformation as an accuracy influence degree, based on the temperature change rate. The accuracy stabilization time period calculation unit calculates a time period until the machine tool accuracy is stabilized as an accuracy stabilization time period, based on the temperature change rate.


Find Patent Forward Citations

Mizoguchi, Yuji. (2024). Accuracy diagnostic device and accuracy diagnostic method for machine tool (U.S. Patent No. 12013233). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12013233

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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