The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 18, 2024

Filed:

Feb. 18, 2022
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Takashi Suzuki, Osaka, JP;

Shinya Takahashi, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/2522 (2013.01); G06T 7/521 (2017.01); G06T 7/55 (2017.01);
Abstract

A shape measuring apparatus includes a stage, a light projecting portion, a light receiving portion, and a rotation unit. The rotation unit is attached to an end of the stage. The rotation unit rotates the measurement subject about a rotation axis that vertically intersects while holding the measurement subject. In a state where the measurement subject is at a predetermined rotation angular position, the pattern light is emitted from the light projecting portion to the measurement subject a plurality of times while being phase-shifted. At this time, the light receiving portion captures an image of the measurement subject. Three-dimensional shape data is generated on the basis of a plurality of pieces of image data obtained by imaging.


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