The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 18, 2024
Filed:
Jul. 27, 2021
Formlabs, Inc., Somerville, MA (US);
Carlos Ruiz-Vargas, Waltham, MA (US);
Robb Morgan, Arlington, MA (US);
Formlabs, Inc., Somerville, MA (US);
Abstract
Techniques are described for calibrating an optical system in an additive fabrication device using an image of the build surface within the device. These techniques allow calibration to be performed by imaging one or more calibration features generated on (or at) the build surface, which may include illuminated regions of the build surface, regions of the build surface on which solid material has been formed, and/or regions of the build surface to which energy has otherwise been directed thereby making those regions distinguishable from their surroundings. The calibration features may be produced (at least in part) by the optical system to be calibrated. The location of the calibration features within the image may be compared with the intended location of these calibration features, and corrections to the optical system determined based on any differences between the actual and intended locations.