The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Feb. 26, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Natsuki Kai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/80 (2023.01); G06T 7/80 (2017.01); H04N 23/63 (2023.01);
U.S. Cl.
CPC ...
H04N 23/80 (2023.01); G06T 7/80 (2017.01); H04N 23/63 (2023.01); G06T 2207/20182 (2013.01);
Abstract

To provide an image pick-up apparatus, an image pick-up method, and a program each of which adapted to perform photometric calibration at a low cost in the application thereof for picking-up images for performing localization. An image pick-up apparatus () includes at least one memory () configured to store an instruction, and at least one processor () configured to execute the instruction, the processor being further configured to: pick-up an image; determine whether the picked-up image data is an image suitable for a computer vision application; and adjust camera parameters based on the determination.


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