The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Oct. 26, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Amir Tavakkoli Kermani Ghariehali, Austin, TX (US);

Edward Brian Fletcher, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/67 (2006.01); B41J 2/005 (2006.01); B41J 2/21 (2006.01); B41M 3/00 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
H01L 21/6715 (2013.01); B41J 2/005 (2013.01); B41J 2/2132 (2013.01); B41M 3/006 (2013.01); G03F 7/0002 (2013.01);
Abstract

An apparatus for imprint lithography can include a logic element configured to generate a fluid droplet pattern of fluid droplets of a formable material to be dispensed onto a substrate. The fluid droplet pattern includes an imprint field, wherein the imprint field has a side and a drop exclusion zone along the side, and the drop exclusion zone is narrower at a first point farther from the center of a side and wider at a second point closer to the center of the side. In another aspect, a method can be carried out using the apparatus. The apparatus and method can be useful in filling an imprint field with a formable material relatively quickly without extrusion defects or other complications.


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