The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Aug. 14, 2019
Koninklijke Philips N.v., Eindhoven, NL;
Fei Zuo, Eindhoven, NL;
Anke Pierik, Eindhoven, NL;
Reinhold Wimberger-Friedl, Waalre, DE;
Koen De Laat, Udenhout, NL;
Marc Van Driel, Nijmegen, NL;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
Currently, there is interest in applying machine learning techniques to analyse digital pathology images automatically. Machine learning techniques often rely on training with a ground-truth image input. The quality and amount of training data determines the quality of the detector, as expressed in the rate of true and false positives, and robustness against variations in the appearance of the input images. The present application proposes to obtain image data of the same sample before and after at least one re-staining step (firstly with a structure-revealing stain, and secondly with a bio marker revealing stain). Sections of the first and second image data having a good registration relationship are chosen, along with the probability of detecting a desired candidate object (such as nucleus) and the probability of the bio marker revealing stain being present annotation data suitable for training a machine learning algorithm on the first and/or the second image data is provided.