The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Dec. 06, 2018
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Jun Takada, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B65G 43/02 (2006.01); B65G 43/08 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); B65G 43/02 (2013.01); B65G 43/08 (2013.01); B65G 2203/0275 (2013.01); B65G 2203/0291 (2013.01); B65G 2203/041 (2013.01); B65G 2203/042 (2013.01); G06T 2207/30108 (2013.01);
Abstract
An inspection device includes an acquisition unit that acquires a plurality of images, captured from a given height, of an inspection object controlled to move at a constant velocity, a comparison unit that compares movements of the inspection object in the images on the basis of the plurality of images, and a determination unit that determines the condition of the inspection object on the basis of a comparison result.