The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Oct. 26, 2020
Applicant:
Duke University, Durham, NC (US);
Inventors:
Krishnendu Chakrabarty, Durham, NC (US);
Arjun Chaudhuri, Durham, NC (US);
Jonti Talukdar, Durham, NC (US);
Assignee:
DUKE UNIVERSITY, Durham, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06N 3/045 (2023.01); G06F 117/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06N 3/045 (2023.01); G06F 2117/02 (2020.01);
Abstract
A system for evaluating fault criticality using machine learning includes a first machine learning module that is trained on a subset of a circuit and used for evaluating whether a node in a netlist of the entire circuit is a critical node, and a second machine learning module specialized to minimize classification errors in nodes predicted as benign. A generative adversarial network can be used to generate synthetic test escape data to supplement data used to train the second machine learning module.