The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Jun. 10, 2022
Splunk, Inc., San Francisco, CA (US);
Kristal Curtis, San Francisco, CA (US);
William Deaderick, Austin, TX (US);
Abraham Starosta, Boston, MA (US);
Splunk Inc., San Francisco, CA (US);
Abstract
A computerized method is disclosed that includes operations of obtaining a data set, selecting candidate parameter pairs to be analyzed, wherein the candidate parameter pairs include a window length and a sensitivity multiplier, and wherein the window length is a number of data points, performing an anomaly detection process for each candidate parameter pair including importing each candidate parameter pair into a predetermined search query thereby generating a set of populated predetermined search queries, wherein the predetermined search query is configured to perform the anomaly detection process, executing each search query of the set of populated predetermined search queries on the data set to obtain a set of anomaly detection results, and scoring each anomaly detection result by applying a set of heuristics to the set of the anomaly detection results, and generating an auto-tuned search query by selecting a first candidate parameter pair based on a score of each of the set of anomaly detection results and importing the first candidate parameter pair into the predetermined search query.