The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Dec. 20, 2021
Google Llc, Mountain View, CA (US);
Srinath Badrinath, Karnataka, IN;
Everett Maus, Seattle, WA (US);
Danhao Guo, San Mateo, CA (US);
Carlos Arguelles, Edmonds, WA (US);
Google LLC, Mountain View, CA (US);
Abstract
A method of populating a test environment for integration testing of a production database. The production database includes a plurality of tables, and may be represented by a directed acyclic graph (DAG), in which each of the plurality of tables is represented by a respective node of the DAG and schema-level constraints of the plurality of tables are represented by edges of the DAG. The method may involve constructing the DAG, topologically ordering the plurality of tables of the production database according to the DAG, randomly generating test data in accordance with the schema-level constraints of the plurality of tables, and populating the randomly generated test data to the test environment according to the topological ordering of the plurality of tables.