The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Dec. 14, 2021
Sap SE, Walldorf, DE;
Johnson Wong, Vancouver, CA;
SAP SE, Walldorf, DE;
Abstract
Large and complex software projects may be distributed over multiple repositories and may use test automation of equivalent scale in continuous integration frameworks to maintain quality of the project. Such test automation often has significant hardware and time costs to run, which may mean that a failure of the software in the test automation takes longer to detect. Delay in fixing the software may increase the chance of more failures getting checked into the software repositories and perpetuating software failures. To address this issue, a ranking of historical test data is determined based on a number of failures for each test and a test configuration is determined based on the ranking such that tests that are ranked higher are performed before tests that are ranked lower. The test may be exited upon detection of failure instead of continuing.