The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Sep. 02, 2021
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Jianlin Guo, Newton, MA (US);
Bryan Liu, Sydney, AU;
Toshiaki Koike Akino, Belmont, MA (US);
Ye Wang, Andover, MA (US);
Kyeong Jin Kim, Lexington, MA (US);
Kieran Parsons, Gloucester, MA (US);
Philip Orlik, Cambridge, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
A computer-implemented pre-processed time-delay autoencoder based anomaly detection method are provided for detecting anomalous states of machines arranged in a factory automation (FA) system or a manufacturing production line. The method includes acquiring source signals from the machines via an interface performing a data pre-processing process for the acquired source signals by normalizing value ranges of the acquired source signals and filtering undesired features from the acquired source signals performing a time-delayed data reform process for the pre-processed source signals based on a time-delay window to generate pre-processed time-delay data submitting pre-processed time-delay testing data to a pre-processed time-delayed autoencoder (Prep-TDAE) neural network, wherein the pre-processed time-delay testing data are collected online while the machines are operated, wherein the Prep-TDAE neural network has been pre-trained by using the pre-processed time-delay training data detecting, if an anomaly state is encountered with respect to the machines, by computing anomaly scores of the pre-processed time-delay testing data, and determining, when the anomaly state is detected, anomaly occurrence time, duration and severity with respect to the anomaly state of each of the machines.