The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Nov. 06, 2023
Quantum Valley Ideas Laboratories, Waterloo, CA;
Su-Peng Yu, Waterloo, CA;
Kent Arnold Nickerson, Waterloo, CA;
Rajesh Pandiyan, Kitchener, CA;
Hadi Amarloo, Waterloo, CA;
Mohammad Noaman, Waterloo, CA;
James P. Shaffer, Kitchener, CA;
Quantum Valley Ideas Laboratories, Waterloo, CA;
Abstract
In a general aspect, a system for measuring radio frequency (RF) electromagnetic waves includes a laser system configured to generate plurality of input optical signals. The system also includes an RF measurement device having first and second mode converters and an internal cavity therebetween. The internal cavity contains a vapor that is configured to produce an output optical signal based on the plurality of input optical signals. The RF measurement device also includes an RF waveguide that extends between the first and second mode converters and is configured to carry the second RF waveguide mode through the internal cavity. The system also includes an optical detector system configured to generate a detector signal in response to receiving the output optical signal. The system additionally includes a signal processing system configured to generate data in response to receiving the detector signal.