The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Feb. 28, 2020
Applicant:
Sony Semiconductor Solutions Corporation, Kanagawa, JP;
Inventor:
Koji Ogawa, Kanagawa, JP;
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORPORATION, Kanagawa, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/257 (2006.01); G01R 19/25 (2006.01); H03F 1/26 (2006.01); C12M 1/34 (2006.01); G01N 27/30 (2006.01);
U.S. Cl.
CPC ...
G01R 19/257 (2013.01); G01R 19/2509 (2013.01); H03F 1/26 (2013.01); C12M 1/3407 (2013.01); G01N 27/301 (2013.01); H03F 2200/21 (2013.01); H03F 2200/504 (2013.01);
Abstract
Provided is a potential measurement device including: a first substrate having read electrodes arranged in a two-dimensional array; and a second substrate on which the first substrate is stacked, in which each of the read electrodes includes at least one or more AD conversion circuits each having independent correspondence to the read electrode, and at least a part of the AD conversion circuits is arranged in a two-dimensional array on the second substrate.
Ogawa, Koji. (2024). Potential measurement device (U.S. Patent No. 12007420). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12007420
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile