The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jun. 04, 2019
Applicant:

National Institute for Materials Science, Ibaraki, JP;

Inventors:

Kosuke Minami, Ibaraki, JP;

Genki Yoshikawa, Ibaraki, JP;

Gaku Imamura, Ibaraki, JP;

Kota Shiba, Ibaraki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 5/02 (2006.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01N 5/02 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

Provided is a novel material analysis technique using a chemical sensor. By reversing the conventional approach, a material to be measured is provided as a receptor of the chemical sensor, and a response signal of the chemical sensor obtained by supplying a known gas or the like to the chemical sensor is obtained. From the response signal, it is possible to identify and distinguish the receptor material, and to obtain its composition and the like. By analyzing the response signal by means of a statistical or machine learning technique such as principal component analysis, linear discriminant analysis, or a support vector machine, the above-mentioned identification and the like can be performed with high accuracy.


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