The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Aug. 27, 2021
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventors:
Takashi Usui, Saitama, JP;
Kazuo Watabe, Kanagawa, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/14 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/14 (2013.01); G01N 29/449 (2013.01); G01N 2291/0289 (2013.01);
Abstract
A measuring method in an embodiment includes detecting elastic waves generated in a structural object formed of a solid material in a non-contact manner and estimating a position of an occurrence source of the elastic waves on the basis of information regarding an intensity of a signal of the detected elastic waves.
Usui, Takashi. (2024). Measuring method and measuring device (U.S. Patent No. 12007363). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12007363
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile