The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Oct. 10, 2019
Applicant:

Indian Institute of Technology Madras (Iit Madras), Chennai, IN;

Inventors:

Nishanth Raja, Chennai, IN;

Krishnan Balasubramanian, Chennai, IN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/032 (2006.01); G01N 29/06 (2006.01); G01N 29/24 (2006.01);
U.S. Cl.
CPC ...
G01N 29/032 (2013.01); G01N 29/0645 (2013.01); G01N 29/2462 (2013.01); G01N 2291/02818 (2013.01); G01N 2291/02836 (2013.01); G01N 2291/02881 (2013.01);
Abstract

The invention discloses methods for simultaneously measuring various properties of a fluid using a waveguide. The method includes transmitting a plurality of wave modes into the fluid using an ultrasonic shear wave transducer from one end of a waveguide. Further, the wave modes are reflected from the other end of the waveguide. The reflected wave modes are processed simultaneously. The time of flight and the amplitude of the received wave modes are determined. Further, one or more properties of the fluid are measured using determined time of flight and amplitude of the received wave modes. The disclosed method is used to accurately measure the properties of fluid such as level, density, viscosity or flow rate in a short period of time.


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