The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jan. 20, 2022
Applicant:

Battelle Memorial Institute, Columbus, OH (US);

Inventors:

Rodney Arthur Hallgren, Philadelphia, PA (US);

Michael Ryan Hausler, Egg Harbor Township, NJ (US);

Allen Kwame Anderson, San Antonio, TX (US);

Assignee:

Battelle Memorial Institute, Columbus, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/046 (2018.01); G01N 23/083 (2018.01); G01N 23/087 (2018.01); G01N 23/10 (2018.01); G01V 5/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/10 (2013.01); G01N 23/04 (2013.01); G01N 23/046 (2013.01); G01N 23/083 (2013.01); G01N 23/087 (2013.01); G01V 5/0016 (2013.01); G06T 11/001 (2013.01); G01N 2223/04 (2013.01); G01N 2223/306 (2013.01); G01N 2223/3307 (2013.01); G01N 2223/401 (2013.01); G01N 2223/403 (2013.01); G01N 2223/408 (2013.01); G01N 2223/639 (2013.01);
Abstract

In an approach to X-ray inspection image display systems, a colorized X-ray inspection image is received comprising a monochrome X-ray inspection image that is colorized in accordance with an X-ray inspection system false colorization scheme. The colorized X-ray inspection image is filtered by performing pixel shading on the colorized X-ray inspection image to generate a custom colorized X-ray inspection image having a custom false colorization scheme that is different from the X-ray inspection system false colorization scheme.


Find Patent Forward Citations

Hallgren, Rodney. (2024). X-ray baggage and parcel inspection system with efficient third-party image processing (U.S. Patent No. 12007341). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12007341

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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