The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2024

Filed:

Jul. 02, 2020
Applicant:

Ckd Corporation, Aichi, JP;

Inventor:

Yukihiro Taguchi, Aichi, JP;

Assignee:

CKD CORPORATION, Aichi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B65B 5/02 (2006.01); B65B 5/10 (2006.01); B65B 57/00 (2006.01); G01N 21/3563 (2014.01); G01N 21/359 (2014.01); G01N 21/86 (2006.01); B29C 51/18 (2006.01); B29C 51/46 (2006.01); B29L 31/00 (2006.01);
U.S. Cl.
CPC ...
G01N 21/86 (2013.01); B65B 5/02 (2013.01); B65B 5/103 (2013.01); B65B 57/00 (2013.01); G01N 21/3563 (2013.01); G01N 21/359 (2013.01); B29C 51/18 (2013.01); B29C 51/46 (2013.01); B29L 2031/712 (2013.01); G01N 2021/869 (2013.01); G01N 2201/127 (2013.01);
Abstract

An inspection device includes: an illumination device that irradiates standard and inspection objects with near-infrared light; a spectroscope that disperses reflected light; an imaging device that takes images of first and second optical spectrums of the reflected light dispersed by the spectroscope to obtain standard spectroscopic image data and inspection spectroscopic image data; and a processor. The processor executes a predetermined arithmetic operation with regard to at least one of (i) each pixel row of the standard spectroscopic image data perpendicular to a wavelength dispersion direction and (ii) each pixel column of the standard spectroscopic image data parallel to the wavelength dispersion direction. The processor, based on luminance values of pixels belonging to the pixel row or column, determines a characteristic of the pixel row and grasps a wavelength sensitivity characteristic of the imaging element under the near-infrared light emitted from the illumination device.


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