The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Mar. 22, 2019
Applicant:
Purdue Research Foundation, West Lafayette, IN (US);
Inventors:
Rohith Chandrasekar, Princeton, NJ (US);
Amr Shaltout, Palo Alto, CA (US);
Vladimir Shalaev, West Lafayette, IN (US);
Alexander Chubykin, West Lafayette, IN (US);
Alexei Lagutchev, West Lafayette, IN (US);
Assignee:
Purdue Research Foundation, West Lafayette, IN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/44 (2006.01); G01N 21/19 (2006.01); G01N 21/25 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0237 (2013.01); G01J 3/2803 (2013.01); G01J 3/44 (2013.01); G01N 21/19 (2013.01); G01N 21/251 (2013.01);
Abstract
A spectroscopic microscope device, including at least one array of metasurfaces, and at least one CCD array integrated with the array of metasurfaces. The metasurfaces in the array are configured to separately direct LCP an RCP components of light incident on the metasurface to separate pixels in the CCD array.