The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Dec. 08, 2020
Schlumberger Technology Corporation, Sugar Land, TX (US);
Jill F. Geddes, Cambridge, GB;
Trevor Lloyd Hughes, Cambridge, GB;
Evgeny Borisovich Barmatov, Cambridge, GB;
Man Yi Ho, Cambridge, GB;
Paul Barnes, Aberdeen, GB;
SCHLUMBERGER TECHNOLOGY CORPORATION, Sugar Land, TX (US);
Abstract
A method for measuring a thickness of a deposit layer on a metal or alloy substrate using an X-ray fluorescence (XRF) spectrometer, where the deposit layer includes scale deposits or corrosion products. As part of the method, an elemental composition of the deposit layer or the metal or alloy substrate is measured using the XRF spectrometer. The thickness of the deposit layer is obtained from the elemental composition using a calibration relationship between deposit layer thicknesses and corresponding elemental compositions of the deposit layer or the metal/alloy substrate. The method can be applied to determine the rate of deposit layer formation and evaluate the effectiveness of a treatment.