The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2024
Filed:
Oct. 01, 2019
Maintech Co., Ltd., Tokyo, JP;
Hiroshi Sekiya, Tokyo, JP;
Hitomaru Sakata, Fuji, JP;
Daisuke Kobayashi, Tokyo, JP;
Ayano Suga, Tokyo, JP;
MAINTECH CO., LTD., Tokyo, JP;
Abstract
An object is to provide a monitoring system capable of preventing the occurrence of a defect in paper by monitoring the device. The present invention is directed to a monitoring system A having a papermaking machinefor manufacturing paper X, an applying devicefor applying a chemical solution to a site of the papermaking machine directly or indirectly in contact with the paper while the papermaking machineis operated, a control panelfor setting an application condition of the applying device, a monitoring camerafor monitoring a monitoring target site, and a control deviceconnected to the monitoring cameravia a network. The monitoring target site is the site of the papermaking machinedirectly or indirectly in contact with the paper X and/or the applying device, and the control devicehas a computing unit Swhich converts a state of the monitoring target site into a numerical form by using video taken by the monitoring camera, a display unit Swhich displays detection data obtained by conversion into the numerical form at the computing unit S, and a storage unit Swhich stores the detection data.