The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Jan. 18, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Mohammed Ali Mohammed Hirzallah, San Diego, CA (US);

Srinivas Yerramalli, San Diego, CA (US);

Rajat Prakash, San Diego, CA (US);

Taesang Yoo, San Diego, CA (US);

Xiaoxia Zhang, San Diego, CA (US);

Roohollah Amiri, San Diego, CA (US);

Marwen Zorgui, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); H04W 72/20 (2023.01); H04W 72/51 (2023.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); H04W 72/20 (2023.01); H04W 72/51 (2023.01);
Abstract

In an aspect, a first user equipment (UE) obtains one or more first radio frequency fingerprint (RFFP) measurements of one or more first downlink channels received at the first UE, one or more first sidelink channels received at the first UE, or both, and determines one or more locations of a target UE based on the one or more first RFFP measurements and a machine learning module, wherein the machine learning module is trained based on previously collected RFFP measurements of one or more downlink channels, RFFP measurements of one or more uplink channels, RFFP measurements of one or more sidelink channels, locations of one or more sidelink anchor UEs, locations of one or more base stations, or any combination thereof.


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