The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Apr. 01, 2022
Applicant:

Zoox, Inc., Foster City, CA (US);

Inventors:

Xuan Zhong, San Jose, CA (US);

Arvind Pattabhiraman, Alameda, CA (US);

David Donald Logan, Morgan Hill, CA (US);

Nam Gook Cho, Cupertino, CA (US);

Venkata Subrahmanyam Chandra Sekhar Chebiyyam, San Francisco, CA (US);

Shaminda Subasingha, San Ramon, CA (US);

Assignee:

ZOOX, INC., Foster City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); B08B 7/02 (2006.01); B08B 13/00 (2006.01); B60S 1/62 (2006.01); B60W 50/02 (2012.01); B60W 50/06 (2006.01); B60W 60/00 (2020.01); H04R 1/02 (2006.01); H04R 1/08 (2006.01); H04R 1/40 (2006.01); H04R 3/00 (2006.01);
U.S. Cl.
CPC ...
H04R 29/005 (2013.01); B08B 7/02 (2013.01); B08B 13/00 (2013.01); B60S 1/62 (2013.01); B60W 50/0205 (2013.01); B60W 50/0225 (2013.01); B60W 50/06 (2013.01); B60W 60/00 (2020.02); H04R 1/025 (2013.01); H04R 1/08 (2013.01); H04R 1/406 (2013.01); H04R 3/005 (2013.01); B60W 2050/021 (2013.01); B60W 2555/20 (2020.02); H04R 2499/13 (2013.01);
Abstract

Techniques for cleaning and calibrating a microphone are discussed herein. For example, a computing device can implement a microphone component to operate a speaker adjacent to a microphone to cause removal of an obstruction (e.g., rain, mud, dirt, dust, snow, ice, animal droppings, etc.) on or near the microphone. The microphone component can also or instead cause the speaker to output a frequency for testing operation of the microphone. By implementing the cleaning and/or calibrating techniques described herein, foreign particle(s) of varying size and type can be dislodged from an area near the microphone to improve performance of the microphone.


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