The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

May. 23, 2023
Applicant:

Tesla Laboratories, Llc, Jackson, WY (US);

Inventor:

Jovan Hutton Pulitzer, Frisco, TX (US);

Assignee:

Tesla Laboratories, LLC, Jackson, WY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/32 (2006.01); G07C 13/02 (2006.01); H04N 1/047 (2006.01);
U.S. Cl.
CPC ...
H04N 1/32352 (2013.01); G07C 13/02 (2013.01); H04N 1/047 (2013.01);
Abstract

A see through apparatus receives a paper document. The see through apparatus includes a first scanning element, a second scanning element, and a processor coupled to the first scanning element and the second scanning element. Each of the first and second scanning elements illuminate a respective side of the paper document while the other scanning element captures an image. The processor detects kinematic artifacts on the paper document and determines that the paper document is fraudulent based on the detected kinematic artifacts. The processor also detects an alignment feature from the image capture from the first image or the second image, and determines that the document is not aligned based on the detected alignment feature.


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