The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
May. 31, 2022
Mitsubishi Electric Corporation, Tokyo, JP;
Takumi Yamamoto, Tokyo, JP;
Aiko Iwasaki, Tokyo, JP;
Hisashi Fukuda, Tokyo, JP;
Kiyoto Kawauchi, Tokyo, JP;
Mitsubishi Electric Corporation, Tokyo, JP;
Abstract
An attribute-value extraction unit () extracts as a plurality of model-generation attribute values, a plurality of attribute values belonging to an attribute associated with a monitoring subject for anomaly detection. A division-data generation unit () extracts for each model-generation attribute value, a normal event associated with the model-generation attribute value from normal data indicating a plurality of normal events each of which is found out to be normal, each of which is associated with one attribute value of the plurality of attribute values, and each of which includes a plurality of characteristics, and generates for each model-generation attribute value, division data indicating the extracted normal event. A characteristic selection unit () selects a combination of characteristics to be used for generation of a normal model to be used for anomaly detection, from a plurality of characteristics included in a plurality of normal events indicated in a plurality of pieces of division data. A normal-model generation unit () generates the normal model for each model-generation attribute value, using the combination of characteristics selected.