The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Sep. 25, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Frank Sieckmann, Eppingen, DE;
Constantin Kappel, Schriesheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
An apparatus for optimizing workflows of one or more microscopes and/or microscope systems includes one or more processors and one or more computer-readable storage media. The one or more computer-readable storage media have stored therein computer-executable instructions, which, when executed by the one or more processors cause execution of the following steps: implementing, by one or more components of the one or more microscopes and/or microscope systems, a workflow comprising a capture of first data; applying one or more trained models to the captured first data; and making at least one decision in relation to the workflow based on the application of the one or more trained models to the captured first data.