The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Feb. 25, 2022
Seiko Epson Corporation, Tokyo, JP;
Taisuke Yamauchi, Matsumoto, JP;
SEIKO EPSON CORPORATION, Tokyo, JP;
Abstract
A measurement method includes measuring a normal vector of a measured portion based on a first vector representing a direction from a measured portion to a principal point of a first lens, a second vector representing a direction from the measured portion to a principal point of a second lens, a third vector representing a direction from the measured portion to a principal point of a third lens, a first value representing luminance of the measured portion in a situation in which the first projector projects a fourth image via the first lens, a second value representing the luminance of the measured portion in a situation in which the second projector projects a fifth image via the second lens, and a third value representing the luminance of the measured portion in a situation in which the third projector projects a sixth image via the third lens.