The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Sep. 20, 2021
Applicant:

Ambarella International Lp, Santa Clara, CA (US);

Inventors:

Wenhai Gao, Shanghai, CN;

Liangliang Wang, Shanghai, CN;

Bo Yu, Shanghai, CN;

Assignee:

Ambarella International LP, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06N 3/02 (2006.01); G06V 10/44 (2022.01); G06V 10/50 (2022.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06N 3/02 (2013.01); G06V 10/443 (2022.01); G06V 10/50 (2022.01);
Abstract

An apparatus comprising an interface, a light projector and a processor. The interface may be configured to receive pixel data. The light projector may be configured to generate a structured light pattern. The processor may be configured to process the pixel data arranged as video frames and generate disparity and depth maps. The processor may comprise convolutional neural network hardware that may arrange reference images into a tensor, perform logical operations on one of the video frames in a depth direction of the tensor to generate a tensor of feature maps of the video frames, use a convolution to reduce an amount of calculations performed in the depth direction of the tensor of feature maps, perform convolution filtering on the tensor of the feature maps, determine an index map location, and search lookup data based on the index map location to determine the disparity and depth maps.


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