The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Jul. 15, 2021
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Donghoon Lee, Cupertino, CA (US);

Thorsten Gernoth, San Francisco, CA (US);

Onur C. Hamsici, Palo Alto, CA (US);

Shuo Feng, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/33 (2017.01); G06N 3/08 (2023.01); G06T 15/20 (2011.01);
U.S. Cl.
CPC ...
G06T 7/344 (2017.01); G06N 3/08 (2013.01); G06T 15/205 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Devices, systems, and methods are disclosed for partial point cloud registration. In some implementations, a method includes obtaining a first set of three-dimensional (3D) points corresponding to an object in a physical environment, the first set of 3D points having locations in a first coordinate system, obtaining a second set of 3D points corresponding to the object in the physical environment, the second set of 3D points having locations in a second coordinate system, predicting, via a machine learning model, locations of the first set of 3D points in the second coordinate system, and determining transform parameters relating the first set of 3D points and the second set of 3D points based on the predicted location of the first set of 3D points in the second coordinate system.


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