The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Aug. 09, 2021
Merck Sharp & Dohme Llc, Rahway, NJ (US);
Dani Kiyasseh, Marina del Rey, CA (US);
Antong Chen, Blue Bell, PA (US);
Albert Joseph Swiston, Jr., Somerville, MA (US);
Ronghua Chen, Needham, MA (US);
Merck Sharp & Dohme LLC, Rahway, NJ (US);
Abstract
Methods and systems are described for image segmentation. A machine learning model is applied to a set of images to generate results. The results may be obtained as a probability map for each image in the set of images. The model may be trained by accessing a set of labeled images, each image associated with a label indicating a location of a feature within a respective image. An initial set of parameters is accessed. An encoder is initialized with the initial set of parameters. The encoder is applied to the set of labeled images to generate a prediction of a feature location within each image. The initial set of parameters are updated based on the predictions and the label associated with the labeled images. The updated set of parameters and an additional set of parameters generated using a set of unlabeled images are aggregated.