The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Oct. 30, 2020
Goertek Inc., Shandong, CN;
GOERTEK INC., Shandong, CN;
Abstract
A character defect detection method and device are disclosed. The character defect detection method comprises: acquiring an image to be inspected containing a character and a template character image corresponding to the character, and converting the image to be inspected into an image having a format consistent with a format of the template character image; extracting a first valid area containing the character from the image to be inspected, and extracting a second valid area containing a template character from the template character image; obtaining a first image based on the first valid area, and obtaining a second image based on the second valid area; calculating a transformed image indicating an information difference between the first image and the second image based on the first image and the second image; and obtaining a character defect detection result of the image to be inspected based on information of the transformed image.