The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Dec. 02, 2019
Beijing University of Technology, Beijing, CN;
BEIJING UNIVERSITY OF TECHNOLOGY, Beijing, CN;
Abstract
Disclosed is a soft measurement method of DXN emission concentration based on multi-source latent feature selective ensemble (SEN) modeling. First, MSWI process data is divided into subsystems of different sources according to industrial processes, and principal component analysis (PCA) is used to separately extract the subsystems' latent features and conduct multi-source latent feature primary selection according to the threshold value of the principal component contribution rate preset by experience. Using mutual information (MI) to evaluate the correlation between the latent features of the primary selection and DXN, and adaptively determine the upper and lower limits and thresholds of the latent feature reselection; finally, based on the reselected latent features, a least squares-support vector machine (LS-SVM) algorithm with a hyperparameter adaptive selection mechanism is used to establish DXN emission concentration sub-models for different subsystems, and based on branch and bound (BB) and prediction error information entropy weighting algorithm to optimize the selection of sub-models and calculation weights coefficient, a SEN soft measurement model of DXN emission concentration is constructed.