The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Aug. 30, 2019
Siemens Aktiengesellschaft, Munich, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method for parameterizing an anomaly detection method, which takes a multiplicity of sensor data points as a basis for performing a density-based cluster method, including a) mapping each sensor data point in a data space into a pixel data point in a pixel space, b) reproducing at least one operation of the density-based cluster method in the data space by means of at least one pixel operation in the pixel space, c) receiving at least one parameter value for each parameter of the density-based cluster method, d) applying the at least one pixel operation in accordance with the parameter values to the pixel data points e) outputting a cluster result in visual form in the pixel space, and f) providing the received parameter values for the anomaly detection method, and an assistance apparatus for parameterizing an anomaly detection apparatus that performs the anomaly detection method.