The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Mar. 28, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hangu Yeo, Yorktown Heights, NY (US);

Octavian Popescu, Yorktown Heights, NY (US);

Elahe Khorasani, Yorktown Heights, NY (US);

Vadim Sheinin, Yorktown Heights, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 16/00 (2019.01); G06F 16/182 (2019.01); G06F 16/21 (2019.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 16/1824 (2019.01); G06F 16/211 (2019.01);
Abstract

A method, system and apparatus of processing queries, including inputting a query as query data, generating paraphrases from the query data, and normalizing the generated paraphrases according to predefined annotations of a schema.


Find Patent Forward Citations

Quick Actions:

Yeo, Hangu. (2024). Accuracy of qa systems by normalizing logical queries (U.S. Patent No. 12001422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12001422

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