The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Jun. 16, 2021
Applicant:

Nec Laboratories Europe Gmbh, Heidelberg, DE;

Inventors:

Felipe Huici, Heidelberg, DE;

Simon Kuenzer, Heidelberg, DE;

Roberto Bifulco, Heidelberg, DE;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 8/41 (2018.01); G06F 9/445 (2018.01); G06F 11/30 (2006.01); G06F 11/34 (2006.01); G06F 16/188 (2019.01); G06F 16/245 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 8/41 (2013.01); G06F 9/44505 (2013.01); G06F 16/245 (2019.01); G06F 8/48 (2013.01); G06F 11/302 (2013.01); G06F 11/3409 (2013.01); G06F 16/188 (2019.01); G06F 2201/865 (2013.01);
Abstract

A method searches and tests for performance optima in an operating system (OS) configuration space. The method includes generating a plurality of OS configurations. For at least a first OS configuration, of the generated OS configurations, the method further includes: fetching a plurality of OS modules based on the first OS configuration; building a first OS image from the fetched OS modules; and testing the first OS image to determine a first value of a performance metric.


Find Patent Forward Citations

Loading…