The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Nov. 20, 2019
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Yu Adachi, Tokyo, JP;
Haruto Tanno, Tokyo, JP;
Yu Yoshimura, Tokyo, JP;
Hiroyuki Kirinuki, Tokyo, JP;
Toshiyuki Kurabayashi, Tokyo, JP;
NIPPON TELEGRAPH AND TELEPHONE CORPORATION, Tokyo, JP;
Abstract
A test data generation device that generates test data to be input into an input field of a test target application includes a storage unit that stores a tacit knowledge test data dictionary including, for each tacit knowledge category, a generation method, test data information, and an input value constraint on an input field to be used as a generation condition, and a generation unit that refers to, regarding a certain tacit knowledge category for a target input field, the tacit knowledge test data dictionary to generate test data for the target input field when an input value constraint of the target input field in the test target application and an input value constraint of a generation condition regarding the tacit knowledge category are determined to match, and not to generate the test data for the target input field when the input value constraint of the target input field and the input value constraint of the generation condition regarding the tacit knowledge category are determined not to match.