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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12001192 B1

PDFFull Text
Date of Patent:
Jun. 04, 2024

Filed:

Mar. 28, 2019

Device adjustment instrument, additive manufacturing device, additive manufacturing method, and program

Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventor:

Yukihiko Inoue, Tokyo, JP;

Assignee:

MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;

Attorney:

Wenderoth, Lind & Ponack, L.L.P.

Primary Examiner:

Ronald D Hartman, Jr

Int. Cl.
CPC ...
G05B 19/4099 (2006.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 10/60 (2021.01); B22F 10/85 (2021.01); B23K 26/342 (2014.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01); B33Y 80/00 (2015.01); G05B 19/4155 (2006.01); B22F 10/36 (2021.01); B23K 101/00 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4099 (2013.01); B22F 10/31 (2021.01); B22F 10/38 (2021.01); B22F 10/60 (2021.01); B22F 10/85 (2021.01); B23K 26/342 (2015.10); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); B33Y 80/00 (2014.12); G05B 19/4155 (2013.01); B22F 10/36 (2021.01); B22F 10/385 (2021.01); B23K 2101/001 (2018.08); B33Y 10/00 (2014.12); G05B 2219/45135 (2013.01); G05B 2219/49023 (2013.01);
Abstract

A device adjustment instrument is provided with a storage unit for storing standard test piece data corresponding to each of a plurality of standard test pieces which can be manufactured by additive manufacturing devices and a standard parameter set for when the standard test pieces are manufactured, a selection unit for selecting standard test piece data that match modeling specification data of a specified object from a plurality of standard test piece data on the basis of the modeling specification data, and an adjustment unit for generating a modeling parameter set for adjusting an operating condition of the additive manufacturing devices on the basis of the selected standard test piece data and the test modeling result data manufactured by the additive manufacturing devices using the standard parameter set corresponding to the standard test piece data.

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