The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Oct. 08, 2021
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Deekshant Saxena, Mumbai, IN;

Senjuti Sen, Manpada, IN;

Assignee:

HERE Global B.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/497 (2006.01); G01S 17/89 (2020.01); G01S 17/931 (2020.01); G06F 16/29 (2019.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G01S 7/497 (2013.01); G01S 17/89 (2013.01); G01S 17/931 (2020.01); G06N 3/02 (2013.01); G06F 16/29 (2019.01);
Abstract

System and methods for creating multi-return map data using single return Lidar data. The systems and methods use a long short-term memory (LSTM) model in combination with a Generative Adversarial Network (GAN) model. The systems and method use a single (1st) return of Lidar at a time stamp and create multiple unseen samples of 2nd and 3rd returns. The LSTM model is used to create a sequential calibration based on incidence angle to choose the optimized 2nd and 3rd return at the same instance of the time stamp. This creates a localized model of three returns from a single return of Lidar and thus provides additional data to generate an HD map.


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