The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Mar. 02, 2022
Applicant:

Roche Molecular Systems, Inc., Pleasanton, CA (US);

Inventors:

Michael Thomas Nguyen, Carlsbad, CA (US);

Sean Ford, Oceanside, CA (US);

Nikolas James Hansen, La Jolla, CA (US);

Assignee:

ROCHE MOLECULAR SYSTEMS, INC., Pleasanton, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B01L 3/00 (2006.01); C12Q 1/6888 (2018.01); B01L 7/00 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); B01L 3/502715 (2013.01); B01L 3/50273 (2013.01); B01L 3/502738 (2013.01); C12Q 1/6888 (2013.01); G01N 35/00029 (2013.01); G01N 35/00871 (2013.01); B01L 7/52 (2013.01); B01L 2200/04 (2013.01); B01L 2200/10 (2013.01); B01L 2300/123 (2013.01); B01L 2300/18 (2013.01); B01L 2300/1822 (2013.01); B01L 2300/1827 (2013.01); B01L 2400/0427 (2013.01); B01L 2400/0481 (2013.01); B01L 2400/0683 (2013.01); G01N 2035/00148 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/00376 (2013.01); G01N 2035/00841 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/0477 (2013.01);
Abstract

In one embodiment, a diagnostic system includes an instrument coupled to a client device and having at least one sample processing bay. The diagnostic system has a software architecture including instrument software (ISW) associated with the instrument. The ISW receives an assay definition file (ADF) that has a control file and an assay analysis module (AAM) file. The processing bay prepares and senses the sample according to parameters in the OPUS file and then generates sensor scan data. The diagnostic system then analyzes the sensor scan data and prepares a report according to the AAM file.


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