The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Feb. 14, 2020
Imec Vzw, Leuven, BE;
Finub James Shirley, Leuven, BE;
Pol Van Dorpe, Leuven, BE;
IMEC VZW, Leuven, BE;
Abstract
The present invention provides an apparatus for detecting photoluminescent light emitted from a sample, said apparatus () comprising at least one light source (), which is configured to emit light of a first and a second wavelength towards a sample comprising photoluminescent particles, wherein said first wavelength is an excitation wavelength for inducing photoluminescent light from said photoluminescent particles, and wherein said second wavelength is longer than said first wavelength and for gathering background noise information from said sample. The apparatus further comprises a photo-detector () for detecting light incident on the photo-detector (); and an interference filter () arranged on the photo-detector (), wherein the interference filter () is configured to selectively collect and transmit light towards the photo-detector () based on an angle of incidence of the light towards the interference filter (), wherein the interference filter () is configured to selectively transmit supercritical angle light from the sample towards the photo-detector () and suppress undercritical angle light from the sample.