The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Nov. 06, 2020
Hitachi High-tech Analytical Science Gmbh, Uedem, DE;
Heinz Jürgen Graf, Kalkar, DE;
Rainer Simons, Kranenburg, DE;
HITACHI HIGH-TECH ANALYTICAL SCIENCE GMBH, Uedem, DE;
Abstract
Spectrometer device () with entrance aperture (), diffraction grating (), two detectors () to spectrally measuring the incoming light (L), the detectors being located on the same side of the dispersion plane. Two vertically focusing mirrors () focus the light onto detectors, the minors being arranged as front row mirrors () and back row minors () along two polygon graphs () offset to each other and to the focal curve. The angles of deflection (cp,) for the front row mirrors are <°, allowing to minimize the offset (dl) of the front row minors () to the focal curve. The distances (d) between the front row minors and corresponding detectors () is minimized while still avoiding collisions between the detectors () and their mounts with back row detectors () and their mounts. The front row mirror elements are overlapping the adjacent back row mirror element.