The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Sep. 19, 2018
Applicant:

Elcometer Limited, Manchester, GB;

Inventors:

Neil James Leonard Bennett, Cheshire, GB;

Jonathan Bouis, Manchester, GB;

Michael Carrington Sellars, Cheshire, GB;

Thomas Partington, Leeds, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/287 (2006.01);
U.S. Cl.
CPC ...
G01B 7/287 (2013.01);
Abstract

A surface profile measuring instrument (), and method, for measuring the surface profile of a substrate (). The surface profile measuring instrument () comprises an electromagnetic probe (), the electromagnetic probe () comprising a probe tip operable to be brought into proximity with a surface of a substrate () to be measured, a drive unit () operable to generate a low frequency magnetic field penetrating the surface of the substrate (), a pick up unit () operable to detect the strength of the magnetic field and output a magnetic field strength reading and a computation unit () operable to determine a surface profile measurement based on the magnetic field strength reading.


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