The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Mar. 15, 2021
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Thomas Guth, Aalen, DE;
Annett Froewis, Oberkochen, DE;
Birgit Huber, Aalen, DE;
Günter Haas, Aalen, DE;
Ana Carolina Mayr Adam, Aalen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A computer-implemented method automatically produces a test plan for measuring a measured object. The method includes obtaining a desired dataset of the measured object. The method includes providing a starting pattern. The providing comprises producing a division. The producing the division comprises applying at least one division function. The division has a plurality of division indices. The method includes producing a target pattern by generating a comparison between the desired dataset and the division. At least one division index is adapted in response to a deviation of the division from the desired dataset. The method includes creating at least one element with at least one piece of pattern information in the test plan in accordance with the target pattern.