The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Aug. 06, 2021
Applicant:

Faro Technologies, Inc., Lake Mary, FL (US);

Inventors:

Evelyn Schmitz, Korntal-Münchingen, DE;

Heiko Bauer, Moeglingen, DE;

Steffen Kappes, Oedheim-Degmarn, DE;

Denis Wohlfeld, Ludwigsburg, DE;

Assignee:

FARO Technologies, Inc., Lake Mary, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/04 (2006.01); G01B 11/25 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01B 11/04 (2013.01); G01B 11/2518 (2013.01); G02B 26/101 (2013.01);
Abstract

Scanning systems and methods for measuring shafts are described. The scanning systems include a support structure and a scanner mounted to the support structure, at least one fixed guide arranged such that the support structure is configured to move along the at least one fixed guide, at least one positional guide arranged such that at least one positional guide is connected to the support structure to guide movement of the scanner along the at least one fixed guide, and an encoder operably coupled to the at least one positional guide and configured to measure, at least, a distance from the encoder to the support structure.


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