The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Jun. 29, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Hidehiko Kanda, Kanagawa, JP;

Takayuki Ushiyama, Chiba, KE;

Takeshi Yazawa, Kanagawa, JP;

Keiji Kuriyama, Saitama, JP;

Akihiro Tomida, Kanagawa, JP;

Yoshinori Nakajima, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01);
Abstract

A technique capable of obtaining the displacement amount of the ejection position of a reaction liquid without changing a test pattern according to the configuration of the ejection head is to be provided. A test pattern including a detection pattern, which extends in a predetermined direction and in which, if divided into two, at least two inks and the reaction liquid are ejected to one area and only the at least two inks or the at least two inks and the reaction liquid of an amount that is smaller than that of the reaction liquid ejected to the one area are ejected to the other area, is printed, and the optical characteristics of the printed detection pattern are obtained. Further, based on the obtained optical characteristics of the detection pattern, the displacement amount of the ejection position of the reaction liquid in the predetermined direction is obtained.


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