The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2024

Filed:

Nov. 13, 2020
Applicants:

Shenzhen Mindray Bio-medical Electronics Co., Ltd., Guangdong, CN;

Shenzhen Mindray Scientific Co., Ltd., Guangdong, CN;

Inventor:

Shuangshuang Li, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/08 (2006.01); A61B 8/00 (2006.01); G01N 29/04 (2006.01);
U.S. Cl.
CPC ...
A61B 8/485 (2013.01); A61B 8/463 (2013.01); A61B 8/469 (2013.01); A61B 8/5223 (2013.01); A61B 8/54 (2013.01); G01N 29/043 (2013.01); G01N 2291/02827 (2013.01);
Abstract

A shear wave elasticity measurement method and a shear wave elasticity imaging system are disclosed. For each pair of corresponding shear waves, an echo signal within a continuous period of time can be obtained only at a third position, so that an elasticity parameter corresponding to the target area can be obtained according to the echo signal within the continuous period of time. Not only the position required for obtaining an echo signal is few, but also the total data volume required for obtaining the echo signal is few. The calculation method is also easy, which significantly reduces the system performance requirement.


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