The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2024
Filed:
Nov. 07, 2022
Zeavision, Llc, Chesterfield, MO (US);
Scott J. Huter, Temecula, CA (US);
Kevin Martin Magrini, Temecula, CA (US);
Edward Allen DeHoog, Long Beach, CA (US);
Jeff Alan Burke, Temecula, CA (US);
Nathan Franklin Engel, Murrieta, CA (US);
ZeaVision, LLC, Chesterfield, MO (US);
Abstract
A reflectometry instrument includes a light source for emitting an illumination beam that illuminates the macula. A portion of the illumination beam is reflected from the macula and forms a detection beam. The detection beam is indicative of macular pigment in the macula. The instrument also includes a first mirror for reflecting the illumination beam toward the macula and for reflecting the detection beam from the macula. The instrument is configured so that the illumination beam and the detection beam remain separated between the macula and the first mirror.