The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 28, 2024
Filed:
Feb. 24, 2020
Apple Inc., Cupertino, CA (US);
Qiming Li, Beijing, CN;
Jie Cui, Santa Clara, CA (US);
Yang Tang, Santa Clara, CA (US);
Hua Li, Beijing, CN;
Andrey Chervyakov, Nizhny Novgorod, RU;
APPLE INC., Cupertino, CA (US);
Abstract
A system, method, and apparatus is provided for performing testing using arrival of angles (AOA). The system, method, and apparatus can receive a first test signal from a first cell; receive a second test signal from a second cell; and perform a test based on AOA of the first test signal and the second test signal. At least one of the first test signal and the second test signal can include a channel state information-reference signal (CSI-RS) signal or a synchronization signal block (SSB) signal. The first test signal can include a different number of SSBs transmitted during an Measurement Timing Configuration (MTC) window when compared to the second test signal. The system, method, and apparatus can receive the first test signal and the second test signal in a time division multiple access (TDMA) manner. The first cell can include a serving cell and the second cell can include a neighboring cell of the serving cell. The system, method, and apparatus can receive the first test signal using a main lobe of an antenna and the second test signal using a side lobe of the antenna.