The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 28, 2024

Filed:

Jul. 07, 2023
Applicant:

Argo Ai, Llc, Pittsburgh, PA (US);

Inventors:

Dustin Ryan Yautz, Wexford, PA (US);

Morgan M. Wagner, Pittsburgh, PA (US);

Eric K. Thong, Palo Alto, CA (US);

Christopher N. St. John, Northville, MI (US);

Assignee:

Argo AI, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G06F 18/22 (2023.01); G06V 10/25 (2022.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); G06F 18/22 (2023.01); G06V 10/25 (2022.01);
Abstract

Devices, systems, and methods are provided for testing and validation of a cleaning system for a sensor such as a camera. A device may capture a first image of a target using the sensor, wherein the sensor is in a clean state, and wherein the target is in a line of sight of the sensor. The device may apply an obstruction to a portion of a lens of the sensor. The device may apply a cleaning system to the lens. The device may capture a post-clean image after applying the cleaning system. The device may determine a post-clean image quality score based on comparing the post clean image to the first image. The device may compare the post-clean image quality score to a validation threshold. The device may determine a validation state of the cleaning system based on the comparison.


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